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Current induced resistive state in cylindrical superconducting films. I. Critical currents measurements

Identifieur interne : 000201 ( Main/Exploration ); précédent : 000200; suivant : 000202

Current induced resistive state in cylindrical superconducting films. I. Critical currents measurements

Auteurs : RBID : ISTEX:10909_1994_Article_BF00753830.pdf

Abstract

We present measurements of critical currents and critical magnetic fields in cylindrical indium films. The most interesting result is that the ratio of the experimental critical current Ic1 to Silsbee's critical value Ic0 practically does not depend on temperature. This ratio was strongly dependent on the film thickness changing from Ic1 ≈ 0.18Ico for the film thickness d = 0.3μm to Ic1 ≈ 1.3Ico for d = 5.5μm. These results cannot be explained in the framework of the existing theoretical models.

DOI: 10.1007/BF00753830

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<div type="abstract" xml:lang="eng">We present measurements of critical currents and critical magnetic fields in cylindrical indium films. The most interesting result is that the ratio of the experimental critical current Ic1 to Silsbee's critical value Ic0 practically does not depend on temperature. This ratio was strongly dependent on the film thickness changing from Ic1 ≈ 0.18Ico for the film thickness d = 0.3μm to Ic1 ≈ 1.3Ico for d = 5.5μm. These results cannot be explained in the framework of the existing theoretical models.</div>
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<abstract lang="eng">We present measurements of critical currents and critical magnetic fields in cylindrical indium films. The most interesting result is that the ratio of the experimental critical current Ic1 to Silsbee's critical value Ic0 practically does not depend on temperature. This ratio was strongly dependent on the film thickness changing from Ic1 ≈ 0.18Ico for the film thickness d = 0.3μm to Ic1 ≈ 1.3Ico for d = 5.5μm. These results cannot be explained in the framework of the existing theoretical models.</abstract>
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